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Proceedings
ISQED
ISQED 2008
2008 9th International Symposium on Quality Electronic Design (ISQED '08)
An On-Demand Test Triggering Mechanism for NoC-Based Safety-Critical Systems
Year: 2008, Pages: 184-189
DOI Bookmark:
10.1109/ISQED.2008.150
Authors
Jason D. Lee
Nikhil Gupta
Praveen S. Bhojwani
Rabi N. Mahapatra
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Abstract
