Exploring the use of virtual learning environments to support science learning in autistic students

J. Cecil; Mary Sweet-Darter; Aaron Cecil-Xavier

doi:10.1109/FIE.2017.8190490

2017 IEEE Frontiers in Education Conference (FIE)

Exploring the use of virtual learning environments to support science learning in autistic students

Year: 2017, Pages: 1-8

DOI Bookmark: 10.1109/FIE.2017.8190490

Authors

J. Cecil, Computer Science, Center for Cyber Physical Systems (CCPS), Oklahoma, State University, Stillwater, USA
Mary Sweet-Darter, Applied Behavioral, Analysis-OK, Anselm Center, Edmond, USA
Aaron Cecil-Xavier, Stillwater High School and CCPS Soaring Eagle Research, Stillwater, Oklahoma

Abstract

A unified FinFET reliability model including high K stack dynamic threshold (HKSDT), hot carrier injection (HCI), and negative bias temperature instability (NBTI) has been developed and verified by experimental data. The FinFET-based circuit performances are simulated and compared under these reliability issues by HSPICE simulator after the inclusion of the presented model.

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Exploring the use of virtual learning environments to support science learning in autistic students

Authors

Abstract

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