Contributing to the Bottom Line: Optimizing Reliability-Cost-Schedule Tradeoff and Architecture Scalability through Test Technology

Proceedings 11th International Symposium on Software Reliability Engineering. ISSRE 2000

Year: 2000, Pages: 136

D. Boyd, ATT
D. Cura, ATT
W. Ehrlich, ATT
R. Gotberg, ATT
R. Hariharan, Prodigy Communications
P. Reeser, AT&T Labs