Abstract
This paper presents a digital domain foreground calibration algorithm for flash analog-to-digital converters (ADC). In deep sub-micron technologies, for low voltage and low power applications, random mismatch appearing in comparator circuits induce large offset voltages. The linearity of a flash ADC gets adversely affected by the offset voltages. In the proposed method, a lookup table (LUT) based offset calibration technique has been introduced to nullify the effect of comparator offset voltages to improve the linearity of the flash ADC. Behavioural simulation result of a 6 bit flash ADC shows that after calibration SNDR gets improved from 28.01 dB to 33.23 dB.