Join Us
Sign In
My Subscriptions
Magazines
Journals
Video Library
Conference Proceedings
Individual CSDL Subscriptions
Institutional CSDL Subscriptions
Resources

IEEE.org
Help

About Us
Career Center
Cart
Create Account
Sign In

My Subscriptions

Conference Cover Image

Previous
Next
Table of Contents
Related Articles

Home
Proceedings
ISVLSID
ISVLSID 2015

2015 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors

Year: 2015, Pages: 627-627

DOI Bookmark: 10.1109/ISVLSI.2015.42

Authors

Athanasios Dimakos
Martin Andraud
Louay Abdallah
Haralampos-S. Stratigopoulos
Emmanuel Simeu
Salvador Mir

Abstract

Sign up for our newsletter.

EMAIL ADDRESS

IEEE COMPUTER SOCIETY

About Us
Board of Governors
Newsletters
Press Room
IEEE Support Center
Contact Us

DIGITAL LIBRARY

Magazines
Journals
Conference Proceedings
Video Library

COMPUTING RESOURCES

Jobs Board
Courses & Certifications
Webinars
Podcasts
Tech News
Membership

COMMUNITY RESOURCES

Conference Organizers
Authors
Chapters
Communities

BUSINESS SOLUTIONS

Corporate Partnerships
Conference Sponsorships & Exhibits
Advertising
Recruiting
Digital Library Institution Subscriptions

POLICIES

Privacy
Accessibility Statement
IEEE Nondiscrimination Policy
XML Sitemap

©IEEE — All rights reserved. Use of this website signifies your agreement to the IEEE Terms and Conditions.

A public charity, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.