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Proceedings
ITC
ITC 1998
Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)
MEMS Fault Model Generation using CARAMEL
Year: 1998, Pages: 557
DOI Bookmark:
10.1109/TEST.1998.743199
Authors
Abhijeet Kolpekwar
,
Carnegie Mellon University
Chris Kellen
,
Carnegie Mellon University
R. D.(Shawn) Blanton
,
Carnegie Mellon University
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