Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)
BUILT IN SELF REPAIR FOR EMBEDDED HIGH DENSITY SRAM
DOI Bookmark: 10.1109/TEST.1998.743312
Authors
Ilyoung Kim, Bell Laboratories - Lucent TechnologiesYervant Zorian, Bell Laboratories - Lucent Technologies
Goh Komoriya, Bell Laboratories - Lucent Technologies
Hai Pham, Bell Laboratories - Lucent Technologies
Frank P. Higgins, Bell Laboratories - Lucent Technologies
Jim L. Lewandowski, Bell Laboratories - Lucent Technologies