A Built-In Self-Repair Analyzer (CRESTA) for embedded DRAMs

Tomoya Kawagoe; Jun Ohtani; Mitsutaka Niiro; Tukas Ooishi; Mitsuhiro Hamada; Hideto Hidaka

doi:10.1109/TEST.2000.894250

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)

A Built-In Self-Repair Analyzer (CRESTA) for embedded DRAMs

Year: 2000, Pages: 567

DOI Bookmark: 10.1109/TEST.2000.894250

Authors

Tomoya Kawagoe, Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,
Jun Ohtani, Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,
Mitsutaka Niiro, Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,
Tukas Ooishi, Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,
Mitsuhiro Hamada, Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,
Hideto Hidaka, Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,

Abstract

A new practical built-in self-repair analyzer algorithm for embedded DRAMs (e-DRAM) achieves 100% detection ability of the repairable chips with 1% area penalty of the target 32Mb embedded DRAM by 4 parallel analyzers. It works at as fast as 500MHz, well beyond targeted e- DRAMs' maximum operation speed around 200MHz+.

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A Built-In Self-Repair Analyzer (CRESTA) for embedded DRAMs

Authors

Abstract

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