Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)
Power Pin Testing: Making the Test Coverage Complete
DOI Bookmark: 10.1109/TEST.2000.894251
Authors
Frans de Jong, Integrated Circuit Laboratory, Philips Consumer Electronics, The NetherlandsBen Kup, Integrated Circuit Laboratory, Philips Consumer Electronics, The Netherlands
Rodger Schuttert, Integrated Circuit Laboratory, Philips Consumer Electronics, The Netherlands