2004 International Conferce on Test
K longest paths per gate (KLPG) test generation for scan-based sequential circuits
DOI Bookmark: 10.1109/TEST.2004.1386956
Authors
W. Qiu, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USAJing Wang, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
D.M.H. Walker, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
D. Reddy
Xiang Lu
Zhuo Li
Weiping Shi
H. Balachandran