Abstract
The IEEE P1450.4 test program flow extension to the STIL standard provides a test program flow description that allow full program generation by design-to-test automation tools, the portability and interchange of test programs between different ATE platforms, and enable greater reuse of program components. With the recent adoption of IEEE 1450 STIL and its extensions, the test program flow extension provide the semiconductor industry the means to greater automation and decrease the time-to-market aspects of new product introductions.