Abstract
This paper presents a novel technique to identify functionally untestable transition faults in latch based designs with multiple clock domains, bringing to light unaddressed issues related to untestable fault identification in such design environments. We also introduce and provide a solution to a new variant of untestability analysis wherein "architectural constraints" are absorbed during the analysis. We give our tool the capability of handling transition faults resulting from defects of varying sizes, and evaluate our tool for various industrial circuits. The proposed algorithm is compared with a state-of-the-art sequential ATPG tool, and our method has shown much better performance both in the context of scan ATPG and functional test development. Results indicate that the proposed technique identifies considerably more untestable transition faults than those that can be deduced from the knowledge of untestable stuck-at faults. Additional insights from our results point to a greater need to eliminate untestable transition faults as compared to stuck-at faults, for more efficient test pattern generation and accurate coverage computation.