2008 IEEE International Test Conference
Detection and Diagnosis of Static Scan Cell Internal Defect
DOI Bookmark: 10.1109/TEST.2008.4700596
Authors
Ruifeng Guo, Mentor Graphics Corp. Wilsonville, OR 97070. ruifeng_guo@mentor.comLiyang Lai, Mentor Graphics Corp. Wilsonville, OR 97070. liyang_lai@mentor.com
Huang Yu, Mentor Graphics Corp. Wilsonville, OR 97070.
Wu-Tung Cheng, Mentor Graphics Corp. Wilsonville, OR 97070. wu-tung_cheng@mentor.com