Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality

Stefan Eichenberger; Jeroen Geuzebroek; Camelia Hora; Bram Kruseman; Ananta Majhi

doi:10.1109/TEST.2008.4700604

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2008 IEEE International Test Conference

Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality

Year: 2008

DOI Bookmark: 10.1109/TEST.2008.4700604

Authors

Stefan Eichenberger, NXP Semiconductors, Gerstweg 2, FD3, 6534AE Nijmegen, The Netherlands
Jeroen Geuzebroek, NXP Semiconductors, Prof. Holstlaan, HTC-37, 5656AA Eindhoven, The Netherlands
Camelia Hora, NXP Semiconductors, Prof. Holstlaan, HTC-37, 5656AA Eindhoven, The Netherlands
Bram Kruseman, NXP Semiconductors, Prof. Holstlaan, HTC-37, 5656AA Eindhoven, The Netherlands
Ananta Majhi, NXP Semiconductors, Prof. Holstlaan, HTC-37, 5656AA Eindhoven, The Netherlands

Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality

Authors

Abstract