Built-in Self-Calibration of On-chip DAC and ADC

Wei Jiang; Vishwani D. Agrawal

doi:10.1109/TEST.2008.4700638

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2008 IEEE International Test Conference

Built-in Self-Calibration of On-chip DAC and ADC

Year: 2008

DOI Bookmark: 10.1109/TEST.2008.4700638

Authors

Wei Jiang, Electrical and Computer Engineering, Auburn University, Auburn, AL 36849. weijiang@auburn.edu
Vishwani D. Agrawal, Electrical and Computer Engineering, Auburn University, Auburn, AL 36849. vagrawal@eng.auburn.edu

Built-in Self-Calibration of On-chip DAC and ADC

Authors

Abstract