2010 IEEE International Test Conference
A high density small size RF test module for high throughput multiple resource testing
DOI Bookmark: 10.1109/TEST.2010.5699232
Authors
M. Kimishima, ADVANTEST Corporation, 336-1, Ohwa, Meiwa-machi, Gunma, 370-0718, JapanS. Mizuno, ADVANTEST Corporation, 336-1, Ohwa, Meiwa-machi, Gunma, 370-0718, Japan
T. Seki, ADVANTEST Corporation, 336-1, Ohwa, Meiwa-machi, Gunma, 370-0718, Japan
H. Takeuti, ADVANTEST Corporation, 336-1, Ohwa, Meiwa-machi, Gunma, 370-0718, Japan
H. Nagami, ADVANTEST Corporation, 336-1, Ohwa, Meiwa-machi, Gunma, 370-0718, Japan
H. Shirasu, ADVANTEST Corporation, 336-1, Ohwa, Meiwa-machi, Gunma, 370-0718, Japan
Y. Haraguti, ADVANTEST Corporation, 336-1, Ohwa, Meiwa-machi, Gunma, 370-0718, Japan
J. Okayasu, ADVANTEST Laboratories Ltd, 48-2, Kamiayashi, Aoba-ku, Sendai-shi, Miyagi, 989-3124, Japan
M. Nakanishi, ADVANTEST Laboratories Ltd, 48-2, Kamiayashi, Aoba-ku, Sendai-shi, Miyagi, 989-3124, Japan