Bolei Xu, College of Computer Science and Technology, Zhejiang University of Technology; College of Information Engineering, Shenzhen University Jingxin Liu, College of Information Engineering, Shenzhen University; Histo Pathology Diagnostic Center, Shanghai Xianxu Hou, College of Information Engineering, Shenzhen University Bozhi Liu, College of Information Engineering, Shenzhen University Guoping Qiu, College of Information Engineering, Shenzhen University; School of Computer Science, The University of Nottingham
Testing multiple device functions in parallel can yield significant test time and cost of test reductions. This paper discusses the planning process and algorithms required to realize an efficient and achievable concurrent test plan.