A MEMS based device interface board

N. Kandalaft; I. Basith; R. Rashidzadeh

doi:10.1109/TEST.2010.5699296

2010 IEEE International Test Conference

A MEMS based device interface board

Year: 2010, Pages: 1-1

DOI Bookmark: 10.1109/TEST.2010.5699296

Authors

N. Kandalaft, Department of Electrical and Computer Engineering, University of Windsor, Canada
I. Basith, Department of Electrical and Computer Engineering, University of Windsor, Canada
R. Rashidzadeh, Department of Electrical and Computer Engineering, University of Windsor, Canada

Abstract

At gigahertz frequency range, performance degradation of the device interface board increases the yield loss and the cost of manufacturing. In this poster a MEMS based solution is proposed to design a Device Interface Board (DIB) supporting high-speed connectivity between the device under test and the tester. Simulation results indicate that the proposed scheme can operate up to 50 GHz without considerable signal integrity degradation.

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A MEMS based device interface board

Authors

Abstract

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