2011 IEEE International Test Conference
Architecture and implementation of a truly parallel ATE capable of measuring pico ampere level current
DOI Bookmark: 10.1109/TEST.2011.6139133
Authors
Dhruva Acharyya, Verigy Inc.Kosuke Miyao, Verigy Inc.
David Ting, Verigy Inc.
Daniel Lam, Verigy Inc.
Robert Smith, Verigy Inc.
Pete Fitzpatrick, Verigy Inc.
Brian Buras, Verigy Inc.
John Williamson, White Eagle Consulting