2014 IEEE International Test Conference (ITC)
Low-cost phase noise testing of complex RF ICs using standard digital ATE
DOI Bookmark: 10.1109/TEST.2014.7035301
Authors
Stephane David-Grignot, LIRMM, CNRS/Univ. Montpellier 2, 161 rue Ada, 34392 Cedex, FranceFlorence Azais, LIRMM, CNRS/Univ. Montpellier 2, 161 rue Ada, 34392 Cedex, France
Laurent Latorre, LIRMM, CNRS/Univ. Montpellier 2, 161 rue Ada, 34392 Cedex, France
Francois Lefevre, NXP Semiconductors - Caen, 2 Esplanade Anton Phillips, 14000, France