2014 IEEE International Test Conference (ITC)
Read disturb fault detection in STT-MRAM
DOI Bookmark: 10.1109/TEST.2014.7035342
Authors
Rajendra Bishnoi, Karlsruhe Institute of Technology, GermanyMojtaba Ebrahimi, Karlsruhe Institute of Technology, Germany
Fabian Oboril, Karlsruhe Institute of Technology, Germany
Mehdi B. Tahoori, Karlsruhe Institute of Technology, Germany