2024 12th International Conference in Software Engineering Research and Innovation (CONISOFT)
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Abstract

Basic requirements and rules of Test and Measurement in RF and Microwaves, as well for characterization on benches as for high volume production using Automatic Test Equipments are described for helping today's test engineers to develop their own customized “turn-key” test solutions. Some examples of RF and microwave tests for Low Noise Amplifier and Mixer that are the devices largely used in Wireless applications are showed. The devices were characterized on benches and automatically tested using ATE testers.
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