Modeling Yield of Carbon-Nanotube/Silicon-Nanowire FET-Based Nanoarray Architecture with h-hot Addressing Scheme

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings.

Year: 2004, Pages: 356-364

Shanrui Zhang, University of Missouri-Rolla
Minsu Choi, University of Missouri-Rolla
Nohpill Park, Oklahoma State University, Stillwater