Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling

Shiling Shi; Stefan Holst; Xiaoqing Wen

doi:10.1109/MCSoC60832.2023.00080

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2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC)

Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling

Year: 2023, Pages: 501-507

DOI Bookmark: 10.1109/MCSoC60832.2023.00080

Authors

Shiling Shi, Kyushu Institute of Technology,Iizuka,Japan,820-8502
Stefan Holst, Kyushu Institute of Technology,Iizuka,Japan,820-8502
Xiaoqing Wen, Kyushu Institute of Technology,Iizuka,Japan,820-8502

Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling

Authors

Abstract