Join Us
Sign In
My Subscriptions
Magazines
Journals
Video Library
Conference Proceedings
Individual CSDL Subscriptions
Institutional CSDL Subscriptions
Resources
Career Center
Tech News
Resource Center
Press Room
Advertising
Librarian Resources
IEEE.org
Help
About Us
Career Center
Cart
Create Account
Sign In
Toggle navigation
My Subscriptions
Browse Content
Resources
All
Previous
Next
Table of Contents
Related Articles
Home
Proceedings
DDECS
DDECS 2013
2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Analysis and comparison of functional verification and ATPG for testing design reliability
Year: 2013, Pages: 275-278
DOI Bookmark:
10.1109/DDECS.2013.6549833
Authors
M. Simkova
,
Fac. of Inf. Technol., Brno Univ. of Technol., Brno, Czech Republic
Z. Kotasek
,
Fac. of Inf. Technol., Brno Univ. of Technol., Brno, Czech Republic
C. Bolchini
,
Dip. Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy
Download PDF
SHARE ARTICLE
Generate Citation
Abstract
Provides a listing of current committee members and society officers.
Like what you’re reading?
Already a member?
Sign In
Member Price
$11
Non-Member Price
$21
Add to Cart
Sign In
Get this article
FREE
with a
new membership
!
Related Articles
Test generation for acyclic sequential circuits with single stuck-at fault combinational ATPG
Design, Automation & Test in Europe Conference & Exhibition
Constrained ATPG for functional RTL circuits using F-Scan
2010 IEEE International Test Conference
Test generation for acyclic sequential circuits with single stuck-at fault combinational ATPG
Design, Automation & Test in Europe Conference & Exhibition
A novel SAT-based ATPG approach for transition delay faults
2017 IEEE International High Level Design Validation and Test Workshop (HLDVT)
A Pseudo-Deterministic Functional ATPG based on EFSM Traversing
2005 Sixth International Workshop on Microprocessor Test and Verification
ATPG with efficient testability measures and partial fault simulation
Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design
ATPG for ultra-large structured designs
1990 International Test Conference
Test generation for acyclic sequential circuits with single stuck-at fault combinational ATPG
Design, Automation & Test in Europe Conference & Exhibition
Functional timing analysis using ATPG
1993 European Conference on Design Automation with the European Event in ASIC Design
Variation-Aware Analysis and Test Pattern Generation Based on Functional Faults
2014 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)