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Proceedings
MTDT
MTDT 1994
Proceedings of IEEE International Workshop on Memory Technology, Design, and Test
A time saving testing scheme for mask ROM based on structure oriented failures
Year: 1994, Pages: 72,73,74,75,76,77
DOI Bookmark:
10.1109/MTDT.1994.397194
Authors
Tsung-Chih Wu
,
United Microelectron. Corp., Hsin-Chu, Taiwan
Chung-Len Lee
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