Join Us
Sign In
My Subscriptions
Magazines
Journals
Video Library
Conference Proceedings
Individual CSDL Subscriptions
Institutional CSDL Subscriptions
Resources
Career Center
Tech News
Resource Center
Press Room
Advertising
Librarian Resources
IEEE.org
Help
About Us
Career Center
Cart
Create Account
Sign In
Toggle navigation
My Subscriptions
Browse Content
Resources
All
Previous
Next
Table of Contents
Home
Proceedings
MTDT
MTDT 2000
Memory Technology, Design and Testin, IEEE International Workshop on
Using GLFSRs for Pseudo-Random Memory BIST
Year: 2000, Pages: 85
DOI Bookmark:
10.1109/MTDT.2000.868620
Authors
Michael Redeker
,
University of Hannover
Markus Rudack
,
University of Hannover
Thomas Lobbe
,
University of Hannover
Dirk Niggemeyer
,
University of Illinois at Urbana-Champaign
Download PDF
SHARE ARTICLE
Generate Citation
Abstract