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Proceedings
MTDT
MTDT 2009
2009 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT)
Impacts of Contact Resistance and NBTI/PBTI on SRAM with High-? Metal-Gate Devices
Year: 2009, Pages: 27-30
DOI Bookmark:
10.1109/MTDT.2009.25
Authors
Hao-I Yang
Ching-Te Chuang
Wei Hwang
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Abstract
