2023 IEEE Symposium on Security and Privacy (SP)
UTopia: Automatic Generation of Fuzz Driver using Unit Tests
DOI Bookmark: 10.1109/SP46215.2023.10179394
Authors
Bokdeuk Jeong, Samsung Research,Republic of KoreaJoonun Jang, Samsung Research,Republic of Korea
Hayoon Yi, Samsung Research,Republic of Korea
Jiin Moon, Samsung Research,Republic of Korea
Junsik Kim, Samsung Research,Republic of Korea
Intae Jeon, Samsung Research,Republic of Korea
Taesoo Kim, Samsung Research,Republic of Korea
WooChul Shim, Samsung Research,Republic of Korea
Yong Ho Hwang, Samsung Research,Republic of Korea