2021 3rd International Conference on System Reliability and Safety Engineering (SRSE)
Research on Failure Mechanism of 976nm Tapered Laser
DOI Bookmark: 10.1109/SRSE54209.2021.00019
Authors
Hongran Wang, Changchun University of Science and Technology,State Key Laboratory of High Power Semiconductor lasers,Changchun,ChinaWenyuan Liao, Institute of the Ministry of Industry and Information Technology,State Key Laboratory The No.5 Electronics Research,Guangzhou,China
Shaohua Yang, Institute of the Ministry of Industry and Information Technology,State Key Laboratory The No.5 Electronics Research,Guangzhou,China
Chengwei Zhang, Changchun University of Science and Technology,State Key Laboratory of High Power Semiconductor lasers,Changchun,China
Guoguang Lu, Institute of the Ministry of Industry and Information Technology,State Key Laboratory The No.5 Electronics Research,Guangzhou,China
Zhipeng Wei, School of Science Changchun University of Science and Technology,State Key Laboratory of High Power Semiconductor Lasers,Changchun,China
Xiaohua Wang, Zhongshan Institute, School of Science Changchun University of Science and Technology,Changchun,China