Abstract
The authors compare the cost of testing for excess of I/sub DDQ/ caused by bridge, break, and transistor stuck-on faults versus the cost of traditional testing methods. It is shown that, since many defects, cause nonlogical faults, I/sub DDQ/ monitoring during the application of test vectors to an IC provides significantly higher defect coverage than using only conventional testing. The costs for I/sub DDQ/ testing are compared with those for SSF (single-stuck-at-fault) testing by modifying an existing SSF ATPG (automatic test pattern generation) system. It is concluded that test generation for I/sub DDQ/ faults is quicker and more complete than for equivalent SSF faults, and even without explicit I/sub DDQ/ test generation, I/sub DDQ/ monitoring can be added to existing SSF testing for increased defect coverage.<>