End-to-end test strategy for wireless systems

M. Jarwala; Duy Le; M.S. Heutmaker

doi:10.1109/TEST.1995.529940

Proceedings of 1995 IEEE International Test Conference (ITC)

End-to-end test strategy for wireless systems

Year: 1995, Pages: 940,941,942,943,944,945,946

DOI Bookmark: 10.1109/TEST.1995.529940

Authors

M. Jarwala, AT&T Bell Labs., Princeton, NJ, USA
Duy Le, AT&T Bell Labs., Princeton, NJ, USA
M.S. Heutmaker, AT&T Bell Labs., Princeton, NJ, USA

Abstract

This paper proposes an end-to-end test strategy for wireless systems described by using wireless microcell as a vehicle. It presents a framework for resting digital and radio frequency (RF) boards in a wireless system and provides an integrated solution. The test strategy is based on two concepts: using boundary-scan for digital testing, and using boundary-scan to provide a gateway for DSP-based functional testing of RF circuits. The test signals are generated within the system and the test control and verification are also provided by the system leading to system self-test.

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End-to-end test strategy for wireless systems

Authors

Abstract

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