Abstract
The following topics are dealt with: microprocessor test; test quality improvement; memory testing; new SERDES test techniques; SoC test; advanced diagnosis algorithms; ATPG; delay test; advanced characterization methods; HF in volume production; power aware testing; PCBA structural defect detection; efficient defect diagnosis; PLL test; test data reduction; debug data reduction; functional test; outlier test; ATE; DFT; analog testing; test power reduction; fault simulation; fault tolerance; error tolerance; nanotechnology; RF test methods; microprocessor defect tolerance; ADC test; boundary-scan-based system test; reliability; at-speed scan test; design-for-debug infrastructure; car IC testing; wafer probing; and statistical testing.