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Proceedings
ITC
ITC 2004

2004 International Conferce on Test

Low overhead delay testing of ASICs

Year: 2004, Pages: 534-542

DOI Bookmark: 10.1109/TEST.2004.1386990

Authors

P. Gillis, IBM Corp., Essex Junction, VT, USA
K. McCauley
F. Woytowich
A. Ferko

Abstract

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