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Proceedings
VLSID
VLSID 1998

VLSI Design, International Conference on

Automated AC (Timing) Characterization for Digital Circuit Testing

Year: 1998, Pages: 374

DOI Bookmark: 10.1109/ICVD.1998.646636

Authors

S. Balajee, Texas Instruments
Ananta K. Majhi, Mentor Graphics Ltd.

Abstract

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