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Proceedings
VLSID
VLSID 2013
VLSI Design, International Conference on
At-speed I/O Test for Fast Vref Optimization in High Speed Single-ended Memory Systems
Year: 2013, Pages: 297-301
DOI Bookmark:
10.1109/VLSID.2013.204
Authors
Sanku Mukherjee
Srinivasaraman Chandrasekaran
Ganapathy Subramanyan E.K.
Arul Sendhil
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