Proceedings of IEEE VLSI Test Symposium
Analog circuit observer blocks
DOI Bookmark: 10.1109/VTEST.1994.292303
Authors
R. Harjani, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USAB. Vinnakota, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA