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Proceedings
VTS
VTS 1999

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146)

Defect-Oriented Test Scheduling

Year: 1999, Pages: 433

DOI Bookmark: 10.1109/VTEST.1999.766700

Authors

Wanli Jiang, University of Minnesota
Bapiraju Vinnakota, University of Minnesota

Abstract

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