An Effective Defect-Oriented BIST Architecture for High-Speed Phase-Locked Loops

We propose a new defect-oriented testing of PLL using charge-based frequency measurement BIST (CF-BIST) technique. As no test stimulus is required and the test output is pure digital, low-cost and practical implementation of on-chip BIST for a PLL is possible. Fault simulations using the 900MHz PLL from National Semiconductor Corp. show higher fault coverage than previous test methods.