2022 IEEE 40th VLSI Test Symposium (VTS)
Innovative Practices Track: What’s Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety
DOI Bookmark: 10.1109/VTS52500.2021.9794190
Authors
Minqiang Peng, Sanechips,ChinaYoufa Wu, Sanechips,China
Jialiang Li, Sanechips,China
Alex Yu, Synopsys,China
Grigor Tshagharyan, Synopsys,Armenia
Costas Argyrides, AMD,USA
Vilas Sridharan, AMD,USA
Gurgen Harutyunyan, Synopsys,Armenia
Yervant Zorian, Synopsys,USA
Nilanjan Mukherjee, Synopsys,Armenia