Proceedings of the Fourth Asian Test Symposium
Nov. 23 1995 to Nov. 24 1995
Bangalore, India
ISBN: 0-8186-7129-7
Table of Contents
Session 1 - Systems Test, Chair: D. Nikolos, University of Patras, Greece
Session 1 - Systems Test, Chair: D. Nikolos, University of Patras, Greece
Session 1 - Systems Test, Chair: D. Nikolos, University of Patras, Greece
Session 1 - Systems Test, Chair: D. Nikolos, University of Patras, Greece
Session 2 - Analysis Techniques, Chair: S. Xu, Shanghai University of Science and Technology, China
Session 2 - Analysis Techniques, Chair: S. Xu, Shanghai University of Science and Technology, China
Session 2 - Analysis Techniques, Chair: S. Xu, Shanghai University of Science and Technology, China
Session 2 - Analysis Techniques, Chair: S. Xu, Shanghai University of Science and Technology, China
Session 3 - Diagnosis, Chair: B. Courtois, TZMA, France
Session 3 - Diagnosis, Chair: B. Courtois, TZMA, France
Session 3 - Diagnosis, Chair: B. Courtois, TZMA, France
Session 3 - Diagnosis, Chair: B. Courtois, TZMA, France
Session 4 - Fault Simulation, Chair: C.L. Lee, National Chiao Tung University, Taiwan
Session 4 - Fault Simulation, Chair: C.L. Lee, National Chiao Tung University, Taiwan
Session 4 - Fault Simulation, Chair: C.L. Lee, National Chiao Tung University, Taiwan
Session 4 - Fault Simulation, Chair: C.L. Lee, National Chiao Tung University, Taiwan
Session 4 - Fault Simulation, Chair: C.L. Lee, National Chiao Tung University, Taiwan
Session 5 - Mixed-Signal Test, Chair: M.M. Hasan, UT Kanpur, India
Session 5 - Mixed-Signal Test, Chair: M.M. Hasan, UT Kanpur, India
Session 5 - Mixed-Signal Test, Chair: M.M. Hasan, UT Kanpur, India
Session 5 - Mixed-Signal Test, Chair: M.M. Hasan, UT Kanpur, India
Session 5 - Mixed-Signal Test, Chair: M.M. Hasan, UT Kanpur, India
Session 6 - Design for Testability, Chair: C-S. Lin, National Taiwan University, Taiwan
Session 6 - Design for Testability, Chair: C-S. Lin, National Taiwan University, Taiwan
Session 6 - Design for Testability, Chair: C-S. Lin, National Taiwan University, Taiwan
Session 6 - Design for Testability, Chair: C-S. Lin, National Taiwan University, Taiwan
Session 6 - Design for Testability, Chair: C-S. Lin, National Taiwan University, Taiwan
Session 7 - Education and Research in Testing, Chair: V.D. Agrawal, AT&T Bell Labs, USA
Session 8 - Testability Measures, Chair: B.B. Bhattacharya, ISI, India
Session 8 - Testability Measures, Chair: B.B. Bhattacharya, ISI, India
Session 8 - Testability Measures, Chair: B.B. Bhattacharya, ISI, India
Session 9 - Delay Test I, Chair: P. Varma, CrossCheck, USA
Session 9 - Delay Test I, Chair: P. Varma, CrossCheck, USA
Session 10 - ATPG, Chair: S. Kundu, IBM, USA
Session 10 - ATPG, Chair: S. Kundu, IBM, USA
Session 10 - ATPG, Chair: S. Kundu, IBM, USA
Session 10 - ATPG, Chair: S. Kundu, IBM, USA
Session 10 - ATPG, Chair: S. Kundu, IBM, USA
Session 11 - BIST, Chair: K. Furuya, Chuo University, Japan
Session 11 - BIST, Chair: K. Furuya, Chuo University, Japan
Session 11 - BIST, Chair: K. Furuya, Chuo University, Japan
Session 11 - BIST, Chair: K. Furuya, Chuo University, Japan
Session 11 - BIST, Chair: K. Furuya, Chuo University, Japan
Session 12 - Self-Checking Circuits, Chair: B. Mitra, Texas Instruments, India
Session 12 - Self-Checking Circuits, Chair: B. Mitra, Texas Instruments, India
Session 12 - Self-Checking Circuits, Chair: B. Mitra, Texas Instruments, India
Session 12 - Self-Checking Circuits, Chair: B. Mitra, Texas Instruments, India
Session 13 - Delay Test II, Chair: Y. Min, ICT, China
Session 13 - Delay Test II, Chair: Y. Min, ICT, China
Session 13 - Delay Test II, Chair: Y. Min, ICT, China
Session 13 - Delay Test II, Chair: Y. Min, ICT, China
Session 14 - Technology-Specific Test, Chair: M. Franklin, Clemson University, USA
Session 14 - Technology-Specific Test, Chair: M. Franklin, Clemson University, USA
Session 15 - Design-Specific Test, Chair: H. Fujiwara, NAIST, Japan
Session 15 - Design-Specific Test, Chair: H. Fujiwara, NAIST, Japan
Session 15 - Design-Specific Test, Chair: H. Fujiwara, NAIST, Japan