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2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Oct. 2 2019 to Oct. 4 2019

Noordwijk, Netherlands

ISBN: 978-1-7281-2260-1

Table of Contents

ForewordFreely available from IEEE.pp. 1-1
Rebooting Computing: The Challenges for Test and ReliabilityFull-text access may be available. Sign in or learn about subscription options.pp. 8138-8143
by A. Bosio, I. O'Connor, G. S. Rodrigues, F. K. Lima, E. I. Vatajelu, G. Di Natale, L. Anghel, S. Nagarajan, M. C. R. Fieback, S. Hamdioui
State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State MachinesFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Hideyuki Ichihara, Yuki Maeda, Tsuyoshi Iwagaki, Tomoo Inoue
Simulating Wear-out Effects of Asymmetric Multicores at the Architecture LevelFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Nikos Foutris, Christos Kotselidis, Mikel Luján
Preventing Scan Attack through Test Response EncryptionFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Satyadev Ahlawat, Jaynarayan Tudu, Manoj Singh Gaur, Masahiro Fujita, Virendra Singh
On-line Testing for Autonomous Systems driven by RISC-V Processor Design VerificationFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Annachiara Ruospo, Riccardo Cantoro, Ernesto Sanchez, Pasquale Davide Schiavone, Angelo Garofalo, Luca Benini
Challenges of Reliability Assessment and Enhancement in Autonomous SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu
Detecting SEUs in Noisy Digital Imagers with small pixelsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Glenn H. Chapman, Rohan Thomas, J. Klinsmann, Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren
Protecting Large Word Size Memories against MCUs with 3-bit Burst Error CorrectionFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Jiaqiang Li, Pedro Reviriego, Liyi Xiao, Alexander Klockmann
CORE-VR: A Coherence and Reusability Aware Low Voltage Fault Tolerant Cache in MulticoreFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Avishek Choudhury, Biplab K Sikdar
Co-relation Scan Attack Analysis (COSAA) on AES: A Comprehensive ApproachFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Dipojjwal Ray, Siddharth Singh, Sk Subidh Ali, Santosh Biswas
A Low Capture Power Oriented X-filling Method Using Partial MaxSAT IterativelyFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Toshinori Hosokawa, Hiroshi Yamazaki, Kenichiro Misawa, Masayoshi Yoshimura, Yuki Hirama, Masavuki Arai, Masayuki Arai
On the Criticality of Caches in Fault-Tolerant Processors for SpaceFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Stefano di Mascio, Alessandra Menicucci, Eberhard Gill, Gianluca Furano, Claudio Monteleone
Low Redundancy Double Error Correction Spotty Codes Combined with Gray Coding for 64 Data Bits Memories of 4-bit Multilevel CellsFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Shanshan Liu, Pedro Reviriego, Kazuteru Namba, Salvatore Pontarelli, Livi Xiao, Fabrizio Lombardi
A State Assignment Method to Improve Transition Fault Coverage for ControllersFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Masayoshi Yoshimura, Yuki Takeuchi, Hiroshi Yamazaki, Toshinori Hosokawa
Reliability Evaluation of Polyphase-filter based Decimators Implemented on SRAM-FPGAsFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Zhen Gao, Jinhua Zhu, Lina Yan, Tong Yan, Pedro Reviriego
Developing a Configurable Fault Tolerant Multicore System for Optimized Sensor ProcessingFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Markus Ulbricht, Rizwan Tariq Syed, Milos Krstic
Scalable and Configurable Multi-Chip SRAM in a Package for Space ApplicationsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Aleksandar Simevski, Patryk Skoncej, Cristiano Calligaro, Milos Krstic
Combining Cluster Sampling and ACE analysis to improve fault-injection based reliability evaluation of GPU-based systemsFull-text access may be available. Sign in or learn about subscription options.pp. 8138-8143
by Alessandro Vallero, Stefano di Carlo
Evaluation of TMR effectiveness for soft error mitigation in SHyLoC compression IP core implemented on Zynq SoC under heavy ion radiationFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Antonio Sánchez, Yubal Barrios, Lucana Santos, Roberto Sarmiento
Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability ApplicationsFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Jerrin Pathrose, Leon van de Logt, Hans G. Kerkhoff
A Fault-Tolerant MPSoC For CubeSatsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Christian M. Fuchs, Pai Chou, Xiaoqing Wen, Nadia M. Murillo, Gianluca Furano, Stefan Holst, Antonios Tavoularis, Shyue-Kunz Lu, Aske Plaat, Kostas Marinis
High Performance Memory RepairFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Feroze Merchant, Anandraj Devarajan, Anik Basu, Dave Ashen, Brandon Yelton, Prashant D. Joshi
Increasing the Efficiency and Efficacy of Selective-Hardening for Parallel ApplicationsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Daniel Oliveira, Philippe Navaux, Paolo Rech
Protecting RSA Hardware Accelerators against Differential Fault Analysis through Residue CheckingFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Ana Lasheras, Ramon Canal, Eva Rodríguez, Luca Cassano
Scatter Scrubbing: A Method to Reduce SEU Repair Time in FPGA Configuration MemoryFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Mahsa Mousavi, Hamid Reza Pourshaghaghi, Henk Corporaal, Akash Kumar
Efficient Error-Tolerant Quantized Neural Network AcceleratorsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Giulio Gambardella, Johannes Kappauf, Michaela Blott, Christoph Doehring, Martin Kumm, Peter Zipf, Kees Vissers
A Comprehensive Evaluation of the Effects of Input Data on the Resilience of GPU ApplicationsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Fritz G. Previlon, Charu Kalra, David R. Kaeli, Paolo Rech
On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGAFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Boyang Du, Sarah Azimi, Corrado de Sio, Ludovica Bozzoli, Luca Sterpone
Understanding of GPU Architectural Vulnerability for Deep Learning WorkloadsFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Danny Santoso, Hyeran Jeon
Fault Tolerant Photovoltaic Array: A Repair Circuit Based on Memristor SensingFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Luca Gnoli, Giuseppe Carnicelli, Alessio Parisi, Luca Urbinati, Burim Kabashi, Fabio Michieletti, Sebastian Ignacio Peradotto Ibarra, Marco Vacca, Mariagrazia Graziano, Jimson Mathew, Marco Ottavi
Parity-Based Concurrent Error Detection Schemes for the ChaCha Stream CipherFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Alexander Zeh, Manuela Meier, Viola Rieger
Testing of In-Memory-Computing 8T SRAMsFull-text access may be available. Sign in or learn about subscription options.pp. 1-4
by Tsai-Ling Tsai, Jin-Fu Li, Chun-Lung Hsu, Chi-Tien Sun
Predicting Single Event Effects in DRAMFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Donald Kline, Stephen Longofono, Rami Melhem, Alex K. Jones
Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash MemoryFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Lucas Matana Luza, Alexandre Bosser, Viyas Gupta, Arto Javanainen, Ali Mohammadzadeh, Luigi Dilillo
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