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2015 IEEE/ACM 1st International Workshop on Complex Faults and Failures in Large Software Systems (COUFLESS)

May 23 2015 to May 23 2015

Florence, Italy

Table of Contents

Title Page iFreely available from IEEE.pp. i-i
Title Page iiiFreely available from IEEE.pp. iii-iii
Copyright PageFreely available from IEEE.pp. iv-iv
Table of ContentsFreely available from IEEE.pp. v-vi
Message from the ChairsFreely available from IEEE.pp. vii-viii
CommitteesFreely available from IEEE.pp. ix-x
Sponsors and SupportersFreely available from IEEE.pp. xi-xi
FLAVS: A Fault Localization Add-In for Visual StudioFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Nan Wang, Zheng Zheng, Zhenyu Zhang, Cheng Chen
The Importance of Being Positive in Causal Statistical Fault Localization: Important Properties of Baah et al.'s CSFL Regression ModelFull-text access may be available. Sign in or learn about subscription options.pp. 7-13
by Zhuofu Bai, Shih-Feng Sun, Andy Podgurski
Evaluating Bug Finders -- Test and Measurement of Static Code AnalyzersFull-text access may be available. Sign in or learn about subscription options.pp. 14-20
by Aurelien Delaitre, Bertrand Stivalet, Elizabeth Fong, Vadim Okun
Cross-Technology, Cross-Layer Defect Detection in IT Systems -- Challenges and AchievementsFull-text access may be available. Sign in or learn about subscription options.pp. 21-26
by Philippe-Emmanuel Douziech, Bill Curtis
The Role of Environmental Assumptions in Failures of DNA NanosystemsFull-text access may be available. Sign in or learn about subscription options.pp. 27-33
by Thein Tun, Robyn Lutz, Brian Nakayama, Yijun Yu, Divita Mathur, Bashar Nuseibeh
Emulating Environment-Dependent Software FaultsFull-text access may be available. Sign in or learn about subscription options.pp. 34-40
by Roberto Pietrantuono, Stefano Russo, Kishor Trivedi
Towards Classification of Concurrency Bugs Based on Observable PropertiesFull-text access may be available. Sign in or learn about subscription options.pp. 41-47
by Sara Abbaspour Asadollah, Hans Hansson, Daniel Sundmark, Sigrid Eldh
Modeling and Verification of Zone Controller: The SCADE Experience in China's Railway SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 48-54
by Jie Qian, Jing Liu, Xiang Chen, Junfeng Sun
Defect Analysis over Multiple Release Versions of a Semiconductor Software SystemFull-text access may be available. Sign in or learn about subscription options.pp. 55-61
by Eric Abuta, Jeff Tian
Crying Wolf and Meaning It: Reducing False Alarms in Monitoring of Sporadic Operations through POD-MonitorFull-text access may be available. Sign in or learn about subscription options.pp. 69-75
by Xiwei Xu, Liming Zhu, Min Fu, Daniel Sun, An Binh Tran, Paul Rimba, Srini Dwarakanathan, Len Bass
Author IndexFreely available from IEEE.pp. 76-76
Publisher's InformationFreely available from IEEE.pp. 78-78
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