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2013 1st International Workshop on Data Analysis Patterns in Software Engineering (DAPSE)

May 21 2013 to May 21 2013

San Francisco, CA, USA

Table of Contents

ContentsFreely available from IEEE.pp. 1-1
ForewordFreely available from IEEE.pp. iii-iv
by Christian Bird, Tim Menzies, Thomas Zimmermann
Building Statistical Language Models of codeFull-text access may be available. Sign in or learn about subscription options.pp. 1-3
by Peter Schulam, Roni Rosenfeld, Premkumar Devanbu
Commit graphsFull-text access may be available. Sign in or learn about subscription options.pp. 4-5
by Maximilian Steff, Barbara Russo
Concept to commit: A pattern designed to trace code changes from user requests to change implementation by analyzing mailing lists and code repositoriesFull-text access may be available. Sign in or learn about subscription options.pp. 6-8
by Scott McGrath, Kiran Bastola, Harvey Siy
Data analysis anti-patterns in empirical software engineeringFull-text access may be available. Sign in or learn about subscription options.pp. 9-10
by Sandro Morasca
Effect size analysisFull-text access may be available. Sign in or learn about subscription options.pp. 11-13
by Emanuel Giger, Harald C. Gall
Exploring software engineering data with formal concept analysisFull-text access may be available. Sign in or learn about subscription options.pp. 14-16
by Xiaobing Sun, Ying Chen, Bin Li, Bixin Li
Extracting artifact lifecycle models from metadata historyFull-text access may be available. Sign in or learn about subscription options.pp. 17-19
by Olga Baysal, Oleksii Kononenko, Reid Holmes, Michael W. Godfrey
Measure what counts: An evaluation pattern for software data analysisFull-text access may be available. Sign in or learn about subscription options.pp. 20-22
by Emmanuel Letier, Camilo Fitzgerald
Parametric classification over multiple samplesFull-text access may be available. Sign in or learn about subscription options.pp. 23-25
by Barbara Russo
Patterns for cleaning up bug dataFull-text access may be available. Sign in or learn about subscription options.pp. 26-28
by Rodrigo Souza, Christina Chavez, Roberto Bittencourt
Patterns for extracting high level information from bug reportsFull-text access may be available. Sign in or learn about subscription options.pp. 29-31
by Rodrigo Souza, Christina Chavez, Roberto Bittencourt
Structural and temporal patterns-based featuresFull-text access may be available. Sign in or learn about subscription options.pp. 32-34
by Venkatesh-Prasad Ranganath, Jithin Thomas
The chunking patternFull-text access may be available. Sign in or learn about subscription options.pp. 35-37
by David M. Weiss, Audris Mockus
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