1. Home
  2. Proceedings
  3. DFTS
  4. DFTS 2015
Default Cover Image

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)

Oct. 12 2015 to Oct. 14 2015

Amherst, MA, USA

Table of Contents

[Front matter]Freely available from IEEE.pp. i-xiv
Evaluating the impact of spike and flicker noise in phase change memoriesFull-text access may be available. Sign in or learn about subscription options.pp. 1-6
by Salin Junsangsri, Fabrizio Lombardi, Jie Han
Fault detection and repair of DSC arrays through memristor sensingFull-text access may be available. Sign in or learn about subscription options.pp. 7-12
by J. Mathew, Y. Yang, M. Ottavi, T. Brown, A. Zampetti, A. Di Carlo, A. M. Jabir, D. K. Pradhan
Asymmetric ECC organization in 3D-memory via spare column utilizationFull-text access may be available. Sign in or learn about subscription options.pp. 13-16
by Hyunseung Han, Joon-Sung Yang
Exploring error-tolerant low-power multiple-output read scheme for memristor-based memory arraysFull-text access may be available. Sign in or learn about subscription options.pp. 17-20
by Adedotun A. Adeyemo, Jimson Mathew, Abusaleh M. Jabir, Dhiraj K. Pradhan
RotR: Rotational redundant task mapping for fail-operational MPSoCsFull-text access may be available. Sign in or learn about subscription options.pp. 21-28
by Badrun Nahar, Brett H. Meyer
On enhancing the debug architecture of a system-on-chip (SoC) to detect software attacksFull-text access may be available. Sign in or learn about subscription options.pp. 29-34
by Jerry Backer, David Hely, Ramesh Karri
Software-based on-chip thermal sensor calibration for DVFS-enabled many-core systemsFull-text access may be available. Sign in or learn about subscription options.pp. 35-40
by Sami Teravainen, Mohammad-Hashem Haghbayan, Amir-Mohammad Rahmani, Pasi Liljeberg, Hannu Tenhunen
Single Event Upsets and Hot Pixels in digital imagersFull-text access may be available. Sign in or learn about subscription options.pp. 41-46
by Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren
Accelerated microarchitectural Fault Injection-based reliability assessmentFull-text access may be available. Sign in or learn about subscription options.pp. 47-52
by Manolis Kaliorakis, Sotiris Tselonis, Athanasios Chatzidimitriou, Dimitris Gizopoulos
Hot spare components for performance-cost improvement in multi-core SIMTFull-text access may be available. Sign in or learn about subscription options.pp. 53-59
by S. Hasan Mozafari, Brett H. Meyer
Low-overhead fault-tolerance for the preconditioned conjugate gradient solverFull-text access may be available. Sign in or learn about subscription options.pp. 60-65
by Alexander Scholl, Claus Braun, Michael A. Kochte, Hans-Joachim Wunderlich
On-line detection of intermittent faults in digital-to-analog convertersFull-text access may be available. Sign in or learn about subscription options.pp. 66-71
by Mani Soma
A Dual-Layer Fault Manager for systems based on Xilinx Virtex FPGAsFull-text access may be available. Sign in or learn about subscription options.pp. 72-75
by I. Herrera-Alzu, M. Lopez-Vallejo, C. Gil Soriano
REPAIR: Hard-error recovery via re-executionFull-text access may be available. Sign in or learn about subscription options.pp. 76-79
by Jyothish Soman, Negar Miralaei, Alan Mycroft, Timothy M. Jones
A method to protect Bloom filters from soft errorsFull-text access may be available. Sign in or learn about subscription options.pp. 80-84
by Pedro Reviriego, Salvatore Pontarelli, Juan Antonio Maestro, Marco Ottavi
Influence of triple-well technology on laser fault injection and laser sensor efficiencyFull-text access may be available. Sign in or learn about subscription options.pp. 85-90
by N. Borrel, C. Champeix, E. Kussener, W. Rahajandraibe, M. Lisart, A. Sarafianos, J-M. Dutertre
Using value similarity of registers for soft error mitigationFull-text access may be available. Sign in or learn about subscription options.pp. 91-96
by Abdulaziz Eker, Oguz Ergin
Security analysis of logic encryption against the most effective side-channel attack: DPAFull-text access may be available. Sign in or learn about subscription options.pp. 97-102
by Muhammad Yasin, Bodhisatwa Mazumdar, Sk Subidh Ali, Ozgur Sinanoglu
Reliable hash trees for post-quantum stateless cryptographic hash-based signaturesFull-text access may be available. Sign in or learn about subscription options.pp. 103-108
by Mehran Mozaffari-Kermani, Reza Azarderakhsh
Chip-level anti-reverse engineering using transformable interconnectsFull-text access may be available. Sign in or learn about subscription options.pp. 109-114
by Shuai Chen, Junlin Chen, Domenic Forte, Jia Di, Mark Tehranipoor, Lei Wang
Scan attack on Elliptic Curve CryptosystemFull-text access may be available. Sign in or learn about subscription options.pp. 115-118
by Sk Subidh Ali, Ozgur Sinanoglu
Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscationFull-text access may be available. Sign in or learn about subscription options.pp. 119-122
by Senwen Kan, Marco Ottavi, Jennifer Dworak
A BIST approach for counterfeit circuit detection based on NBTI degradationFull-text access may be available. Sign in or learn about subscription options.pp. 123-126
by Puneet Ramesh Savanur, Phaninder Alladi, Spyros Tragoudas
Quest for a quantum search algorithm for testing stuck-at faults in digital circuitsFull-text access may be available. Sign in or learn about subscription options.pp. 127-132
by Muralidharan Venkatasubramanian, Vishwani D. Agrawal, James J. Janaher
Piecewise-functional broadside tests based on intersections of reachable statesFull-text access may be available. Sign in or learn about subscription options.pp. 133-138
by Irith Pomeranz
Predictive LBIST model and partial ATPG for seed extractionFull-text access may be available. Sign in or learn about subscription options.pp. 139-146
by G. Contreras, N. Ahmed, L. Winemberg, M. Tehranipoor
A CMOS ripple detector for integrated voltage regulator testingFull-text access may be available. Sign in or learn about subscription options.pp. 147-150
by Cagatay Ozmen, Aydin Dirican, Nurettin Tan, Hieu Nguyen, Martin Margala
Adaptive fault simulation on many-core microprocessor systemsFull-text access may be available. Sign in or learn about subscription options.pp. 151-154
by Mohammad-Hashem Haghbayan, Sami Teravainen, Amir-Mohammad Rahmani, Pasi Liljeberg, Hannu Tenhunen
Compacting output responses containing unknowns using an embedded processorFull-text access may be available. Sign in or learn about subscription options.pp. 155-160
by Kamran Saleem, Sreenivaas S. Muthyala, Nur A. Touba
Impact of test compression on power supply noise controlFull-text access may be available. Sign in or learn about subscription options.pp. 161-166
by Tengteng Zhang, D.M.H. Walker
Improving X-tolerant combinational output compaction via input rotationFull-text access may be available. Sign in or learn about subscription options.pp. 167-170
by Asad Amin Bawa, Nur A. Touba
Low-power LDPC decoder design exploiting memory error statisticsFull-text access may be available. Sign in or learn about subscription options.pp. 171-176
by Junlin Chen, Lei Wang
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technologyFull-text access may be available. Sign in or learn about subscription options.pp. 177-182
by Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos
Approximate compressors for error-resilient multiplier designFull-text access may be available. Sign in or learn about subscription options.pp. 183-186
by Zhixi Yang, Jie Han, Fabrizio Lombardi
Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronicsFull-text access may be available. Sign in or learn about subscription options.pp. 187-190
by Daniele Felici, Sandro Bonacini, Marco Ottavi
Reducing the performance overhead of resilient CMPs with substitutable resourcesFull-text access may be available. Sign in or learn about subscription options.pp. 191-196
by A. Malek, S. Tzilis, D.A. Khan, I. Sourdis, G. Smaragdos, C. Strydis
Dependable real-time task execution scheme for a many-core platformFull-text access may be available. Sign in or learn about subscription options.pp. 197-204
by Tomohiro Yoneda, Masashi Imai, Hiroshi Saito, Kenji Kise
Towards reliability and performance-aware Wireless Network-on-Chip designFull-text access may be available. Sign in or learn about subscription options.pp. 205-210
by Michael Opoku Agyeman, Kin-Fai Tong, Terrence Mak
A fast and scalable fault injection framework to evaluate multi/many-core soft error reliabilityFull-text access may be available. Sign in or learn about subscription options.pp. 211-214
by Felipe Rosa, Fernanda Kastensmidt, Ricardo Reis, Luciano Ost
A cross-layer approach to online adaptive reliability prediction of transient faultsFull-text access may be available. Sign in or learn about subscription options.pp. 215-220
by Bahar Farahani, Saeed Safari
A non-conservative software-based approach for detecting illegal CFEs caused by transient faultsFull-text access may be available. Sign in or learn about subscription options.pp. 221-226
by Diego Rodrigues, Ghazaleh Nazarian, Alvaro Moreira, Luigi Carro, Georgi Gaydadjiev
A configurable board-level adaptive incremental diagnosis technique based on decision treesFull-text access may be available. Sign in or learn about subscription options.pp. 227-232
by Cristiana Bolchini, Luca Cassano
IntelliCAN: Attack-resilient Controller Area Network (CAN) for secure automobilesFull-text access may be available. Sign in or learn about subscription options.pp. 233-236
by Mohammad Raashid Ansari, Shucheng Yu, Qiaoyan Yu
Showing 44 out of 44