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European Dependable Computing Conference

Apr. 28 2010 to Apr. 30 2010

Valencia, Spain

ISBN: 978-0-7695-4007-8

Table of Contents

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Keynote AbstractsFull-text access may be available. Sign in or learn about subscription options.pp. xvii-xviii
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Title Page iFreely available from IEEE.pp. i
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Title Page iiiFreely available from IEEE.pp. iii
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[Copyright notice]Freely available from IEEE.pp. iv
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Message from the General ChairFreely available from IEEE.pp. viii
Table of contentsFreely available from IEEE.pp. v-vii
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Message from the Program ChairFreely available from IEEE.pp. ix
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Organizing CommitteeFreely available from IEEE.pp. x
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Program CommitteeFreely available from IEEE.pp. xi-xiii
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Steering CommitteeFreely available from IEEE.pp. xiv-xiv
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list-reviewerFreely available from IEEE.pp. xv-xvi
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Comparing and Validating Measurements of Dependability AttributesFull-text access may be available. Sign in or learn about subscription options.pp. 3-12
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Slice Your Bug: Debugging Error Detection Mechanisms Using Error Injection SlicingFull-text access may be available. Sign in or learn about subscription options.pp. 13-22
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Emulation of Transient Software Faults for Dependability Assessment: A Case StudyFull-text access may be available. Sign in or learn about subscription options.pp. 23-32
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Evaluating and Comparing the Impact of Software Faults on Web ServersFull-text access may be available. Sign in or learn about subscription options.pp. 33-42
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Towards On-line Adaptation of Fault Tolerance MechanismsFull-text access may be available. Sign in or learn about subscription options.pp. 45-54
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On Hardware Resource Consumption for Aspect-Oriented Implementation of Fault ToleranceFull-text access may be available. Sign in or learn about subscription options.pp. 61-66
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Partitioned Embedded Architecture Based on Hypervisor: The XtratuM ApproachFull-text access may be available. Sign in or learn about subscription options.pp. 67-72
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Software Process Synthesis in Assurance Based Development of Dependable SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 75-84
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Towards Understanding the Importance of Variables in Dependable SoftwareFull-text access may be available. Sign in or learn about subscription options.pp. 85-94
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Early Consensus in Message-Passing Systems Enriched with a Perfect Failure Detector and Its Application in the Theta ModelFull-text access may be available. Sign in or learn about subscription options.pp. 107-116
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HP: Hybrid Paxos for WANsFull-text access may be available. Sign in or learn about subscription options.pp. 117-126
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Eventual Leader Election in Infinite Arrival Message-Passing System Model with Bounded ConcurrencyFull-text access may be available. Sign in or learn about subscription options.pp. 127-134
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D2HT: The Best of Both Worlds, Integrating RPS and DHTFull-text access may be available. Sign in or learn about subscription options.pp. 135-144
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Analysis of Inter-Module Error Propagation Paths in Monolithic Operating System KernelsFull-text access may be available. Sign in or learn about subscription options.pp. 175-184
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Narrowing Down Possible Causes of Performance Anomaly in Web ApplicationsFull-text access may be available. Sign in or learn about subscription options.pp. 185-190
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Finding Error Handling Bugs in OpenSSL Using CoccinelleFull-text access may be available. Sign in or learn about subscription options.pp. 191-196
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Beyond Attack Trees: Dynamic Security Modeling with Boolean Logic Driven Markov Processes (BDMP)Full-text access may be available. Sign in or learn about subscription options.pp. 199-208
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Online Monitoring of Software System ReliabilityFull-text access may be available. Sign in or learn about subscription options.pp. 209-218
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Codesign and Simulated Fault Injection of Safety-Critical Embedded Systems Using SystemCFull-text access may be available. Sign in or learn about subscription options.pp. 221-229
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How to Speed-Up Fault-Tolerant Clock Generation in VLSI Systems-on-Chip via PipeliningFull-text access may be available. Sign in or learn about subscription options.pp. 230-239
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Author IndexFreely available from IEEE.pp. 241
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[Publisher's information]Freely available from IEEE.pp. 242
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