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2016 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC)

Aug. 16 2016 to Aug. 16 2016

Santa Barbara, CA, USA

Table of Contents

Title Page iFreely available from IEEE.pp. i-i
Title Page iiiFreely available from IEEE.pp. iii-iii
Copyright PageFreely available from IEEE.pp. iv-iv
Table of ContentsFreely available from IEEE.pp. v-vi
PrefaceFreely available from IEEE.pp. vii-vii
Workshop OrganizationFreely available from IEEE.pp. viii-viii
Program CommitteeFreely available from IEEE.pp. ix-ix
Additional ReviewersFreely available from IEEE.pp. x-x
AcknowledgmentsFreely available from IEEE.pp. xi-xi
Attacks on Encrypted Memory and Constructions for Memory ProtectionFull-text access may be available. Sign in or learn about subscription options.pp. 1-3
Differential Fault Analysis of SHA3-224 and SHA3-256Full-text access may be available. Sign in or learn about subscription options.pp. 4-15
Improved Fault Analysis on SIMON Block Cipher FamilyFull-text access may be available. Sign in or learn about subscription options.pp. 16-24
Controlling PC on ARM Using Fault InjectionFull-text access may be available. Sign in or learn about subscription options.pp. 25-35
Attack on a DFA Protected AES by Simultaneous Laser Fault InjectionsFull-text access may be available. Sign in or learn about subscription options.pp. 36-46
Continuous-Time Computational Aspects of Cyber-Physical SecurityFull-text access may be available. Sign in or learn about subscription options.pp. 59-62
Lattice-Based Signature Schemes and Their Sensitivity to Fault AttacksFull-text access may be available. Sign in or learn about subscription options.pp. 63-77
An Embedded Digital Sensor against EM and BB Fault InjectionFull-text access may be available. Sign in or learn about subscription options.pp. 78-86
More Efficient Private Circuits II through Threshold ImplementationsFull-text access may be available. Sign in or learn about subscription options.pp. 114-124
Author IndexFreely available from IEEE.pp. 125-125
Publisher's InformationFreely available from IEEE.pp. 126-126
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