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2024 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)

Sept. 4 2024 to Sept. 4 2024

Halifax, NS, Canada

ISBN: 979-8-3503-8036-1

Table of Contents

Title Page iFreely available from IEEE.pp. 1-1
Title Page iiiFreely available from IEEE.pp. 3-3
Copyright PageFreely available from IEEE.pp. 4-4
Table of ContentsFreely available from IEEE.pp. 5-6
PrefaceFreely available from IEEE.pp. 7-8
Organizing CommitteeFreely available from IEEE.pp. 9-9
Program CommitteeFreely available from IEEE.pp. 10-10
KeynotesFreely available from IEEE.pp. 11-12
SponsorsFreely available from IEEE.pp. 13-13
Improving CPU Fault Injection Simulations: Insights from RTL to Instruction-Level ModelsFull-text access may be available. Sign in or learn about subscription options.pp. 1-9
by Jasper van Woudenberg, Rajesh Velegalati, Cees-Bart Breunesse, Dennis Vermoen Riscure
PoP DRAM: A new EMFI approach based on EM-induced glitches on SoCFull-text access may be available. Sign in or learn about subscription options.pp. 10-21
by Clément Fanjas, Driss Aboulkassimi, Simon Pontié, Jessy Clédière
Switch-Glitch : Location of Fault Injection Sweet Spots by Electro-Magnetic EmanationFull-text access may be available. Sign in or learn about subscription options.pp. 22-27
by Matthias Probst, Michael Gruber, Manuel Brosch, Tim Music, Georg Sigl
MAYo or MAY-not: Exploring Implementation Security of the Post-Quantum Signature Scheme MAYO Against Physical AttacksFull-text access may be available. Sign in or learn about subscription options.pp. 28-33
by Thomas Aulbach, Soundes Marzougui, Jean-Pierre Seifert, Vincent Quentin Ulitzsch
A Single-Trace Fault Injection Attack on Hedged Module Lattice Digital Signature Algorithm (ML-DSA)Full-text access may be available. Sign in or learn about subscription options.pp. 34-43
by Sönke Jendral, John Preuß Mattsson, Elena Dubrova
Fault Injection Attacks Exploiting High Voltage Pulsing over Si-Substrate Backside of IC chipsFull-text access may be available. Sign in or learn about subscription options.pp. 44-52
by Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata
FaultyGarble: Fault Attack on Secure Multiparty Neural Network InferenceFull-text access may be available. Sign in or learn about subscription options.pp. 53-64
by Mohammad Hashemi, Dev Mehta, Kyle Mitard, Shahin Tajik, Fatemeh Ganji
Author IndexFreely available from IEEE.pp. 65-65
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