Proceedings International Test Conference 2001 (Cat. No.01CH37260)
Oct. 30 2001 to Nov. 1 2001
Baltimore, Maryland
ISBN: 0-7803-7171-2
Table of Contents
SPECIAL PANEL: CHANGING ECONOMICS OF SOC TESTING: WHO OWNS THE MARKET?
SPECIAL PANEL: CHANGING ECONOMICS OF SOC TESTING: WHO OWNS THE MARKET?
SPECIAL PANEL: CHANGING ECONOMICS OF SOC TESTING: WHO OWNS THE MARKET?
SPECIAL PANEL: CHANGING ECONOMICS OF SOC TESTING: WHO OWNS THE MARKET?
SESSION 1: PLENARY
SESSION 2: IEEE 1149 — BEYOND DC TESTING AT BOARD TEST
SESSION 2: IEEE 1149 — BEYOND DC TESTING AT BOARD TEST
SESSION 2: IEEE 1149 — BEYOND DC TESTING AT BOARD TEST
SESSION 3: BIST MEDLEY
SESSION 4: HOW CAN WE INPROVE IDDQ TESTING FOR DSM/VDSM?
SESSION 4: HOW CAN WE INPROVE IDDQ TESTING FOR DSM/VDSM?
SESSION 5: PRACTICAL EXPERIENCE WITH SOC TESTING
SESSION 5: PRACTICAL EXPERIENCE WITH SOC TESTING
SESSION 5: PRACTICAL EXPERIENCE WITH SOC TESTING
SESSION 6: SOME THORNY PROBLEMS FOR ATE SOFTWARE
SESSION 6: SOME THORNY PROBLEMS FOR ATE SOFTWARE
SESSION 6: SOME THORNY PROBLEMS FOR ATE SOFTWARE
SESSION 7: LECTURE SERIES — TEST AND REPAIR OF LARGE EMBEDDED DRAMS
SESSION 7: LECTURE SERIES — TEST AND REPAIR OF LARGE EMBEDDED DRAMS
SESSION 7: LECTURE SERIES — TEST AND REPAIR OF LARGE EMBEDDED DRAMS
SESSION 8: DFT INNOVATIONS
SESSION 8: DFT INNOVATIONS
SESSION 9: ON-LINE TEST
SESSION 10: NOVEL TECHNIQUES FOR FAULT DIAGNOSIS
SESSION 10: NOVEL TECHNIQUES FOR FAULT DIAGNOSIS
SESSION 10: NOVEL TECHNIQUES FOR FAULT DIAGNOSIS
SESSION 10: NOVEL TECHNIQUES FOR FAULT DIAGNOSIS
SESSION 11: TESTING ABOVE A GIGAHERTZ
SESSION 11: TESTING ABOVE A GIGAHERTZ
SESSION 11: TESTING ABOVE A GIGAHERTZ
SESSION 12: TEST METHODS FOR HIGH-DENSITY MODULES
SESSION 12: TEST METHODS FOR HIGH-DENSITY MODULES
SESSION 12: TEST METHODS FOR HIGH-DENSITY MODULES
SESSION 13: HIGH-QUALITY TEST
SESSION 14: NEW IDDX AND ENERGY TEST TECHNIQUES
SESSION 14: NEW IDDX AND ENERGY TEST TECHNIQUES
SESSION 14: NEW IDDX AND ENERGY TEST TECHNIQUES
SESSION 15: ATE HARDWARE: IMPROVING YOUR TEST RESULTS
SESSION 15: ATE HARDWARE: IMPROVING YOUR TEST RESULTS
SESSION 15: ATE HARDWARE: IMPROVING YOUR TEST RESULTS
SESSION 16: ADVANCED MICROPROCESSOR TEST METHODOLOGIES
SESSION 16: ADVANCED MICROPROCESSOR TEST METHODOLOGIES
SESSION 16: ADVANCED MICROPROCESSOR TEST METHODOLOGIES
SESSION 17: LECTURE SERIES — SOLVING BOARD TEST AND IN-SYSTEM PROBLEMS
SESSION 17: LECTURE SERIES — SOLVING BOARD TEST AND IN-SYSTEM PROBLEMS
SESSION 17: LECTURE SERIES — SOLVING BOARD TEST AND IN-SYSTEM PROBLEMS
SESSION 18: MIXED-SIGNAL TESTING TECHNIQUES
SESSION 18: MIXED-SIGNAL TESTING TECHNIQUES
SESSION 18: MIXED-SIGNAL TESTING TECHNIQUES
SESSION 19: ADVANCED TECHNIQUES FOR EMBEDDED CORE TESTING
SESSION 19: ADVANCED TECHNIQUES FOR EMBEDDED CORE TESTING
SESSION 19: ADVANCED TECHNIQUES FOR EMBEDDED CORE TESTING
SESSION 20: TEST GENERATION FOR CROSSTALK FAULTS
SESSION 20: TEST GENERATION FOR CROSSTALK FAULTS
SESSION 20: TEST GENERATION FOR CROSSTALK FAULTS
SESSION 21: MICROPROCESSOR TESTING
SESSION 21: MICROPROCESSOR TESTING
SESSION 22: STANDARDS AND TECHNIQUES — BOARD TEST DEVELOPMENT
SESSION 22: STANDARDS AND TECHNIQUES — BOARD TEST DEVELOPMENT
SESSION 22: STANDARDS AND TECHNIQUES — BOARD TEST DEVELOPMENT
SESSION 24: IDEAS FOR LOW-POWER SCAN OPERATION
SESSION 24: IDEAS FOR LOW-POWER SCAN OPERATION
SESSION 24: IDEAS FOR LOW-POWER SCAN OPERATION
SESSION 25: UNCOVERING AND UNDERSTANDING WHY CIRCUITS FAIL
SESSION 25: UNCOVERING AND UNDERSTANDING WHY CIRCUITS FAIL
SESSION 25: UNCOVERING AND UNDERSTANDING WHY CIRCUITS FAIL
SESSION 26: ATE HW: CONQUERING THOSE STUBBORN TEST PROBLEMS
SESSION 26: ATE HW: CONQUERING THOSE STUBBORN TEST PROBLEMS