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2018 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

April 9 2018 to April 13 2018

Västerås, Sweden

Table of Contents

[Title page i]Freely available from IEEE.pp. 1-1
[Title page iii]Freely available from IEEE.pp. 3-3
[Copyright notice]Freely available from IEEE.pp. 4-4
Table of contentsFreely available from IEEE.pp. 5-10
Message from the ICST 2018 Program ChairsFreely available from IEEE.pp. 11-12
Message from the Mutation 2018 General ChairsFreely available from IEEE.pp. 13-13
Mutation 2018 CommitteesFreely available from IEEE.pp. 14-14
Message from the ITEQS 2018 Workshop ChairsFreely available from IEEE.pp. 15-15
ITEQS 2018 CommitteesFreely available from IEEE.pp. 16-16
Message from the VVIoT 2018 ChairsFreely available from IEEE.pp. 17-17
VVIoT 2018 CommitteesFreely available from IEEE.pp. 18-18
Welcome Message and Committees for NEXTA 2018Freely available from IEEE.pp. 19-21
Message from the A-MOST 2018 General ChairsFreely available from IEEE.pp. 22-22
A-MOST 2018 CommitteesFreely available from IEEE.pp. 23-23
Message from the InSTA 2018 ChairsFreely available from IEEE.pp. 24-24
InSTA 2018 CommitteesFreely available from IEEE.pp. 25-25
Message from the IWCT 2018 Workshop ChairsFreely available from IEEE.pp. 26-27
IWCT 2018 CommitteesFreely available from IEEE.pp. 28-28
Message from the TAIC PART 2018 ChairsFreely available from IEEE.pp. 29-29
A Systematic Review of Cost Reduction Techniques for Mutation Testing: Preliminary ResultsFull-text access may be available. Sign in or learn about subscription options.pp. 1-10
by Fabiano Cutigi Ferrari, Alessandro Viola Pizzoleto, Jeff Offutt
To Detect Abnormal Program Behaviours via Mutation DeductionFull-text access may be available. Sign in or learn about subscription options.pp. 11-17
by Jie Zhang, Dan Hao, Lingming Zhang, Lu Zhang
If You Can't Kill a Supermutant, You Have a ProblemFull-text access may be available. Sign in or learn about subscription options.pp. 18-24
by Rahul Gopinath, Björn Mathis, Andreas Zeller
Mull It Over: Mutation Testing Based on LLVMFull-text access may be available. Sign in or learn about subscription options.pp. 25-31
by Alex Denisov, Stanislav Pankevich
Mutant Quality IndicatorsFull-text access may be available. Sign in or learn about subscription options.pp. 32-39
by Mike Papadakis, Thierry Titcheu Chekam, Yves Le Traon
MUSIC: Mutation Analysis Tool with High Configurability and ExtensibilityFull-text access may be available. Sign in or learn about subscription options.pp. 40-46
by Duy Loc Phan, Yunho Kim, Moonzoo Kim
An Industrial Application of Mutation Testing: Lessons, Challenges, and Research DirectionsFull-text access may be available. Sign in or learn about subscription options.pp. 47-53
by Goran Petrovic, Marko Ivankovic, Bob Kurtz, Paul Ammann, René Just
A Testability Analysis Framework for Non-functional PropertiesFull-text access may be available. Sign in or learn about subscription options.pp. 54-58
by Michael Felderer, Bogdan Marculescu, Francisco Gomes de Oliveira Neto, Robert Feldt, Richard Torkar
Model-Based Mutation Testing of Real-Time Systems via Model CheckingFull-text access may be available. Sign in or learn about subscription options.pp. 59-68
by Florian Lorber, Kim G. Larsen, Brian Nielsen
Identifying Useful Mutants to Test Time PropertiesFull-text access may be available. Sign in or learn about subscription options.pp. 69-76
by Birgitta Lindström, Jeff Offutt, Loreto Gonzalez-Hernandez, Sten F. Andler
Learning-Based Self-Adaptive Assurance of Timing Properties in a Real-Time Embedded SystemFull-text access may be available. Sign in or learn about subscription options.pp. 77-80
by Mahshid Helali Moghadam, Mehrdad Saadatmand, Markus Borg, Markus Bohlin, Björn Lisper
Scan Code Injection Flaws in HTML5-Based Mobile ApplicationsFull-text access may be available. Sign in or learn about subscription options.pp. 81-88
by Phi Tuong Lau
A Framework for Threat-Driven Cyber Security Verification of IoT SystemsFull-text access may be available. Sign in or learn about subscription options.pp. 89-97
by Tomas Kulik, Peter W.V. Tran-Jørgensen, Jalil Boudjadar, Carl Schultz
Architectures and Experiences in Testing IoT CommunicationsFull-text access may be available. Sign in or learn about subscription options.pp. 98-103
by Teemu Kanstrén, Jukka Mäkelä, Pekka Karhula
A Brief Overview of Existing Tools for Testing the Internet-of-ThingsFull-text access may be available. Sign in or learn about subscription options.pp. 104-109
by João Pedro Dias, Flávio Couto, Ana C.R. Paiva, Hugo Sereno Ferreira
Requirements for Testing and Validating the Industrial Internet of ThingsFull-text access may be available. Sign in or learn about subscription options.pp. 110-115
by Liliana Antão, Rui Pinto, João Reis, Gil Gonçalves
Test Automation - Automation of What?Full-text access may be available. Sign in or learn about subscription options.pp. 116-117
by Yvan Labiche
Challenges in Automated Testing Through Graphical User InterfaceFull-text access may be available. Sign in or learn about subscription options.pp. 118-121
by Pekka Aho, Tanja Vos
Assessing Technical Debt in Automated Tests with CodeSceneFull-text access may be available. Sign in or learn about subscription options.pp. 122-125
by Adam Tornhill
Evaluating Test Data Generation for Untyped Data Structures Using Genetic AlgorithmsFull-text access may be available. Sign in or learn about subscription options.pp. 126-129
by Ralf Gerlich, Christian R. Prause
Feature-Based Testing by Using Model Synthesis, Test Generation and Parameterizable Test PrioritizationFull-text access may be available. Sign in or learn about subscription options.pp. 130-137
by Martin Reider, Stephan Magnus, Jan Krause
Introducing Automated GUI Testing and Observing Its Benefits: An Industrial Case Study in the Context of Law-Practice Management SoftwareFull-text access may be available. Sign in or learn about subscription options.pp. 138-145
by Vahid Garousi, Erdem Yildirim
Automatically Generating Test Scripts for GUI TestingFull-text access may be available. Sign in or learn about subscription options.pp. 146-150
by Muneyoshi Iyama, Hiroyuki Kirinuki, Haruto Tanno, Toshiyuki Kurabayashi
Maintenance of Android Widget-Based GUI Testing: A Taxonomy of Test Case Modification CausesFull-text access may be available. Sign in or learn about subscription options.pp. 151-158
by Riccardo Coppola, Maurizio Morisio, Marco Torchiano
The Next Level of Test Automation: What About the Users?Full-text access may be available. Sign in or learn about subscription options.pp. 159-162
by Kristian Wiklund, Monika Wiklund
Design of High Confidence Embedded Software Hardware-in-Loop Simulation Test Platform Based on Hierarchical ModelFull-text access may be available. Sign in or learn about subscription options.pp. 163-168
by Fei Deng, Feng Gao
Software Metrics for Policy-Driven Software Development Life Cycle AutomationFull-text access may be available. Sign in or learn about subscription options.pp. 169-174
by Leonid Borodaev, Alexandru Telea, Rix Groenboom, Rein Smedinga
A Model-Based Test Case Management Approach for Integrated Sets of Domain-Specific ModelsFull-text access may be available. Sign in or learn about subscription options.pp. 175-184
by Reinhard Pröll, Bernhard Bauer
Generation of C++ Unit Tests from Abstract State Machines SpecificationsFull-text access may be available. Sign in or learn about subscription options.pp. 185-193
by Silvia Bonfanti, Angelo Gargantini, Atif Mashkoor
SPYH-Method: An Improvement in Testing of Finite-State MachinesFull-text access may be available. Sign in or learn about subscription options.pp. 194-203
by Michal Soucha, Kirill Bogdanov
Modelling Hand Gestures to Test Leap Motion Controlled ApplicationsFull-text access may be available. Sign in or learn about subscription options.pp. 204-213
by Thomas D. White, Gordon Fraser, Guy J. Brown
Temporal Logic Falsification of Cyber-Physical Systems: An Input-Signal-Space Optimization ApproachFull-text access may be available. Sign in or learn about subscription options.pp. 214-223
by Arend Aerts, Bryan Tong Minh, Mohammad Reza Mousavi, Michel A. Reniers
Lightweight Model-Based Testing for Enterprise ITFull-text access may be available. Sign in or learn about subscription options.pp. 224-230
by Bernard Elodie, Ambert Fabrice, Legeard Bruno, Bouzy Arnaud
Testing of Big Data Analytics Systems by BenchmarkFull-text access may be available. Sign in or learn about subscription options.pp. 231-238
by Mingang Chen, Wenjie Chen, Lizhi Cai
Test Case Reduction Based on the Join Condition in Pairwise Coverage-Based Database TestingFull-text access may be available. Sign in or learn about subscription options.pp. 239-243
by Yuper Lay Myint, Hironori Washizaki, Yoshiaki Fukazawa, Hideyuki Kanuka, Hiroki Ohbayashi
Model-Based Security Testing - Deriving Test Models from Artefacts of Security EngineeringFull-text access may be available. Sign in or learn about subscription options.pp. 244-251
by Armin Lunkeit, Ina Schieferdecker
Software Test Architectures and Advanced Support Environments for IoTFull-text access may be available. Sign in or learn about subscription options.pp. 252-256
by Jon D Hagar
Extending the UML Testing Profile with a Fine-Grained Test Logging ModelFull-text access may be available. Sign in or learn about subscription options.pp. 257-266
by Marc-Florian Wendland, Niels Hoppe, Martin Schneider, Steven Ulrich
Proposal for Enhancing UTP2 with Test AspectsFull-text access may be available. Sign in or learn about subscription options.pp. 267-272
by Makoto Nakakuki, Koki Abe, Hitoshi Ando, Shizuka Ban, Hiroki Iseri, Kumiko Iseri, Noriyuki Mizuno, Tomohiro Odan, Akiharu Satoh
A Test Architecture for Machine Learning ProductFull-text access may be available. Sign in or learn about subscription options.pp. 273-278
by Yasuharu Nishi, Satoshi Masuda, Hideto Ogawa, Keiji Uetsuki
A Survey of Software Quality for Machine Learning ApplicationsFull-text access may be available. Sign in or learn about subscription options.pp. 279-284
by Satoshi Masuda, Kohichi Ono, Toshiaki Yasue, Nobuhiro Hosokawa
A Satisfiability-Based Approach to Generation of Constrained Locating ArraysFull-text access may be available. Sign in or learn about subscription options.pp. 285-294
by Hao Jin, Takashi Kitamura, Eun-Hye Choi, Tatsuhiro Tsuchiya
Optimal Scheduling for Combinatorial Software Testing and Design of ExperimentsFull-text access may be available. Sign in or learn about subscription options.pp. 295-301
by Robert V. Binder
Enumerator: An Efficient Approach for Enumerating all Valid t-tuplesFull-text access may be available. Sign in or learn about subscription options.pp. 302-305
by Hanefi Mercan, Kamer Kaya, Cemal Yilmaz
Combinatorial Test Design – A Smarter Way to Connect with the BusinessFull-text access may be available. Sign in or learn about subscription options.pp. 306-307
by Saritha Route, Sudheer Pendela
Migrating Combinatorial Interaction Test Modeling and Generation to the WebFull-text access may be available. Sign in or learn about subscription options.pp. 308-317
by Angelo Gargantini, Marco Radavelli
CAMETRICS: A Tool for Advanced Combinatorial Analysis and Measurement of Test SetsFull-text access may be available. Sign in or learn about subscription options.pp. 318-327
by Manuel Leithner, Kristoffer Kleine, Dimitris E. Simos
Combinatorial Testing with Constraints for Negative Test CasesFull-text access may be available. Sign in or learn about subscription options.pp. 328-331
by Konrad Fögen, Horst Lichter
The Effect of Time-Between-Events for Sequence Interaction Testing of a Real-Time SystemFull-text access may be available. Sign in or learn about subscription options.pp. 332-340
by Chek Pin Yang, Gunwant Dhadyalla, James Marco, Paul Jennings
Practical Amplification of Condition/Decision Test Coverage by Combinatorial TestingFull-text access may be available. Sign in or learn about subscription options.pp. 341-347
by Artur Andrzejak, Thomas Bach
Combining Combinatorial Testing and Metamorphic Testing for Testing a Logic-Based Non-monotonic Reasoning SystemFull-text access may be available. Sign in or learn about subscription options.pp. 348-351
by Franz Wotawa
Adapting Unit Tests by Generating Combinatorial Test DataFull-text access may be available. Sign in or learn about subscription options.pp. 352-355
by Hermann Felbinger, Franz Wotawa, Mihai Nica
Support for Finding Presentation Failures by Using Computer Vision TechniquesFull-text access may be available. Sign in or learn about subscription options.pp. 356-363
by Haruto Tanno, Yuu Adachi
Applying Automated Test Case Generation in Industry: A RetrospectiveFull-text access may be available. Sign in or learn about subscription options.pp. 364-369
by Rudolf Ramler, Claus Klammer, Georg Buchgeher
On the Automation of Testing a Logic-Based Diagnosis SystemFull-text access may be available. Sign in or learn about subscription options.pp. 370-373
by Franz Wotawa
Effects of an Economic Approach for Test Case Selection and Reduction for a Large Industrial ProjectFull-text access may be available. Sign in or learn about subscription options.pp. 374-379
by Thomas Bach, Ralf Pannemans, Sascha Schwedes
Tailoring ISO/IEC/IEEE 29119-3 Standard for Small and Medium-Sized EnterprisesFull-text access may be available. Sign in or learn about subscription options.pp. 380-389
by Paulo Eira, Pedro Guimarães, Mónica Melo, Miguel A. Brito, António Silva, Ricardo J. Machado
Verification of Cyber-Physical Automotive Systems-of-Systems: Test Environment AssignmentFull-text access may be available. Sign in or learn about subscription options.pp. 390-391
by Hermann Kaindl, Franz Lukasch, Matthias Heigl, Sevan Kavaldjian, Christoph Luckeneder, Sebastian Rausch
A Topic Model and Test History-Based Test Case Recommendation Method for Regression TestingFull-text access may be available. Sign in or learn about subscription options.pp. 392-397
by Hirohisa Aman, Takashi Nakano, Hideto Ogasawara, Minoru Kawahara
Risk-Driven Model-Based Testing of Washing Machine Software: An Industrial Case StudyFull-text access may be available. Sign in or learn about subscription options.pp. 398-403
by Abdülhadi Kirkici, Ceren Sahin Gebizli, Hasan Sözer
Author IndexFreely available from IEEE.pp. 405-407
[Publisher's information]Freely available from IEEE.pp. 408-408
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